Authors : Z.Zerrougui , A. Merzouki and D. Vincent
Abstract: New microwave electronic technology challenges require integration of many passive components on chips. Among them, isolators and circulators are non reciprocal passive devices which contain magnetic materials. Hence, it is important to know the magnetic properties. The permeability tensor is the most important parameter to define, because it governs the interaction between the wave and the material, origin of all magnetic phenomenons. Our study consists in doing the characterization of thin film of BaM and YIG over frequency range of 0.4 to 65 GHz, shows specially gyroresonance phenomenon and finds resonance frequencies. The technique is based on the S parameters measurement of the magnetic materials with a network Analyser and a probe tester. Polder�s model is used to calculate the different elements of the permeability tensor, which consider the ferrite at its saturated state. The results are discussed and compared to those obtained by using a Spectral Domain Approach (SDA).
Z.Zerrougui , A. Merzouki and D. Vincent , 2006. A High Frequency Characterization of a Thin Film Ferrite, Application to the BaM and YIG . Journal of Engineering and Applied Sciences, 1: 428-433.