Journal of Engineering and Applied Sciences

Year: 2018
Volume: 13
Issue: 14 SI
Page No. 10962 - 10966

Estimation the Required Beam Current to Eliminate the Mirror Effect

Authors : Muayyed Jabar Zoory, Saif Mohammed Altimime and Bahaa Jawad Alwan

Abstract: This research studies the distribution of the restricted ion on the surface of the sample (PMMA) Poly-Methyl Methacrylate by irradiating it with an ion beam inside Focusing Ion Beam device (FIB). Using the charged disc approach, the mathematical description for the process of charging restricted ions on the surface of the sample has been provided. Although, the theoretical formulation has been provided depending on simple ideas of electricity, however, it provided fairly consistent results with practical results. In the current work, a theoretical relationship was derived to help researchers overcome the mirror effect for the first time.

How to cite this article:

Muayyed Jabar Zoory, Saif Mohammed Altimime and Bahaa Jawad Alwan, 2018. Estimation the Required Beam Current to Eliminate the Mirror Effect. Journal of Engineering and Applied Sciences, 13: 10962-10966.

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