Authors : Mohammed H. Hwidi, Laith M. Abduljabbar and Amna Emad
Abstract: Thin films of cadmium telluride were deposited using (PLD) technique on a several glass substrates at average temperature range of 300�C. Different cadmium telluride thin films which has a thickness (250, 350 and 450 nm) were used in this study. Properties of cadmium telluride films such as (optical and structural) were studied. All optical charact eristics of the preparation films were characterized using FTIR spectrophotometer (Shimadzu 8400 S) in the range (300-1800) nm. From this measurements, the band gaps energies for different fabricated thickness (250, 350 and 450 nm) were found to be 2.35, 2.565 and 2.76 eV, respectively. The values of the band gaps increased with increasing the thickness of the fabricated films. The alterations of crystalline structure of the prepared thin films were analyzed and studied using XRD procedure. Diffractometer (Shimadzu 6000 made in Japan) was used in the measurements of XRD. The X-ray measurements showed that all CdTe samples are consisting of randomly oriented crystalline parts and have a structure of cubic zinc blend with preferential mode in the [111] direction. The particle size and a lattice constant of the fabricated cadmium telluride films were calculated. The films with higher thickness which has a grain size greater than the other samples.
Mohammed H. Hwidi, Laith M. Abduljabbar and Amna Emad, 2019. Laser Effect on Optical and Structural Properties of CdTe: Al Thin Films Prepared by Pulsed Laser Deposition Technique. Journal of Engineering and Applied Sciences, 14: 2302-2308.