Abstract: This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.
Jamil Al Azzeh, Daniel Monday Afodigbokwu, Denis Olegovich Bobyntsev and Igor Valerievich Zotov, 2016. Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips. Asian Journal of Information Technology, 15: 3082-3086.