Asian Journal of Information Technology

Year: 2016
Volume: 15
Issue: 16
Page No. 3082 - 3086

Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips

Authors : Jamil Al Azzeh, Daniel Monday Afodigbokwu, Denis Olegovich Bobyntsev and Igor Valerievich Zotov

Abstract: This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.

How to cite this article:

Jamil Al Azzeh, Daniel Monday Afodigbokwu, Denis Olegovich Bobyntsev and Igor Valerievich Zotov, 2016. Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips. Asian Journal of Information Technology, 15: 3082-3086.

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