Authors : Bonghwan Kim, Dongsu Lee, Kihak Lee and Kyunghan Chun
Abstract: The consistent calibration of DIC for indentation mark verification to ensure the electrical stability and reliability of Anisotropic Conductive Film (ACF) joints is investigated. Differential Interference Contrast (DIC) microscopy is a powerful visualization tool used to verify the indentation mark in the ACF image. It’s use and setting to acquire the best image, however is not easy and not quantitative. The inherent nonlinear relationship between the object properties and the image intensity makes quantitative setting and analysis difficult. To apply consistent calibration, four calibration variables are considered and the calibration of the DIC prism slider is quantized. For the best image, the gray scale of the image is also quantized. From the test result, the proper calibration is chosen and applied.
Bonghwan Kim, Dongsu Lee, Kihak Lee and Kyunghan Chun, 2017. DIC Consistent Calibration for Indentation Mark Verification in ACF Images. Journal of Engineering and Applied Sciences, 12: 6666-6671.