Authors : R.A. Castro, G.A. Bordovskii, N.I. Anisimova and A.A. Kononov
Abstract: Low-frequency processes of dielectric relaxation were studied in Ge28.5 Pb15 S56.5 glassy system. The existence of distribution of relaxators over relaxation times is found in line with the Cole-Cole Model for the case of symmetric distribution of relaxation times. The activation energy of dielectric relaxation was equal to Ep = 0.40±0.01 eV. The observed patterns are explained in terms of the model, according to which the structure of chalcogenide glasses represents a set of dipoles formed by charged defects of D+ and D- types.
R.A. Castro, G.A. Bordovskii, N.I. Anisimova and A.A. Kononov, 2018. Low Frequency Processes of Dielectric Relaxation in Ge28.5 Pb15 S56.5 Glassy System. Journal of Engineering and Applied Sciences, 13: 5498-5501.