Asian Journal of Information Technology

Year: 2016
Volume: 15
Issue: 16
Page No. 3082 - 3086

Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips

Authors : Jamil Al Azzeh, Daniel Monday Afodigbokwu, Denis Olegovich Bobyntsev and Igor Valerievich Zotov

References

Arabi, K. and B. Kaminska, 1996. Oscillation-test strategy for analog and mixed-signal integrated circuits. Proceedings of the 14th Symposium on VLSI Test, April 28- May 1, 1996, IEEE, Quebec, Canada, ISBN:0-8186-7304-4, pp: 476-482.

Burns, M. and G.W. Roberts, 2001. An Introduction to Mixed-Signal IC Test and Measurement. Oxford University Press, London, England, UK., ISBN:9780195140163, Pages: 684.

Hurst, S.L., 1998. VLSI Testing: Digital and Mixed Analog-Digital Techniques. The Institution of Electrical Engineere, London, UK., ISBN:0-85296-901-5, Pages: 535.

Rajsuman, R., 2000. System-on-a-Chip: Design and Test. Artech House Inc, Norwood, Massachusetts, USA., ISBN:9781580531078, Pages: 277.

Soma, M. and V. Kolarik, 1994. A design-for-test technique for switched-capacitor filters. Proceedings of the 12th IEEE Symposium on VLSI Test, April 25-28, 1994, IEEE, Seattle, Washington, ISBN:0-8186-5440-6, pp: 42-47.

Vazquez, D., A. Rueda and J.L. Huertas, 1994. A new strategy for testing analog filters. Proceedings of the 12th IEEE Symposium on VLSI Test, April 25-28, 1994, IEEE, Seville, Spain, ISBN:0-8186-5440-6, pp: 36-41.

Wagner, K.D. and T.W. Williams, 1988. Design for testability of mixed signal integrated circuits. Proceedings of the Test International Conference on New Frontiers in Testing, September 12-14, 1988, IEEE, New York, USA., ISBN:0-8186-0870-6, pp: 823-828.

Wang, C.P. and C.L. Wey, 1996. Test generation of analog switched-current circuits. Proceedings of the Fifth Asian Conference on Test Symposium, November 20-22, 1996, IEEE, East Lansing, Michigan, ISBN:0-8186-7478-4, pp: 276-281.

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