Journal of Engineering and Applied Sciences

Year: 2018
Volume: 13
Issue: 14 SI
Page No. 10962 - 10966

Estimation the Required Beam Current to Eliminate the Mirror Effect

Authors : Muayyed Jabar Zoory, Saif Mohammed Altimime and Bahaa Jawad Alwan

References

Bai, M., R.F.W. Pease, C. Tanasa, M.A. McCord and D.S. Pickard et al., 1999. Charging and discharging of electron beam resist films. J. Vac. Sci. Technol. B. Microelectron. Nanometer Struct. Process. Meas. Phenom., 17: 2893-2896.
CrossRef  |  Direct Link  |  

Chen, H., H. Gong and C.K. Ong, 1994. Classical electron trajectory in scanning electron microscope mirror image method. J. Appl. Phys., 76: 806-809.
Direct Link  |  

Chen, H., H. Gong and C.K. Ong, 1995. Determination of charge distribution volume in electron irradiated insulators by scanning electron microscope. J. Appl. Phys., 78: 3714-3718.
CrossRef  |  Direct Link  |  

Clarke, D.R. and P.R. Stuart, 1970. An anomalous contrast effect in the scanning electron microscope. J. Phys. E. Sci. Instrum., 3: 1-705.
CrossRef  |  Direct Link  |  

Croccolo, F. and C. Riccardi, 2008. Observation of the ionā€mirror effect during microscopy of insulating materials. J. Microsc., 229: 39-43.
CrossRef  |  PubMed  |  Direct Link  |  

Fakhfakh, S., N. Ghorbel, O. Jbara, S. Rondot and D. Martin et al., 2004. A new method for charge trapping measurement during electron beam irradiation: Application to glass containing alkali ions and single-crystalline quartz. J. Phys. D. Appl. Phys., 37: 2181-2181.
Direct Link  |  

Fakhfakh, S., O. Jbara, M. Belhaj, Z. Fakhfakh and A. Kallel et al., 2002. Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms. Nuc. Instrum. Methods Phys. Res. Sect. B. Beam Interac. Mater. At., 197: 114-127.
CrossRef  |  Direct Link  |  

Rau, E.I., S. Fakhfakh, M.V. Andrianov, E.N. Evstafeva and O. Jbara et al., 2008. Second crossover energy of insulating materials using stationary electron beam under normal incidence. Nucl. Instrum. Methods Phys. Res. Sect. B. Beam Interact. Mater. At., 266: 719-729.
CrossRef  |  Direct Link  |  

Shaffner, T.J. and R.D. Van Veld, 1971. Charging effects in the scanning electron microscope. J. Phys. E. Sci. Instrum., 4: 633-633.
Direct Link  |  

Vallayer, B., G. Blaise and D. Treheux, 1999. Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties. Rev. Sci. Instrum., 70: 3102-3112.
CrossRef  |  Direct Link  |  

Wintle, H.J., 1997. Interpretation of Atomic Force Microscope (AFM) signals from surface charge on insulators. Meas. Sci. Technol., 8: 508-508.
Direct Link  |  

Zoory, M.J. and M.M. Abid, 2018. Study a scanning beam current in focusing ion beam device of overcome mirror effect. Opt. Intl. J. Light Electron Opt., 158: 1470-1477.
CrossRef  |  Direct Link  |  

Zoory, M.J., 2013. Study the properties of polymer PVC using ion mirror effect. Al Mustansiriya J. Sci., 24: 34-50.

Zoory, M.J., 2014. New way to overcome on the mirror effect for imaging the surface of insulator. IOSR. J. Appl. Phys., 6: 12-20.
Direct Link  |  

Zoory, M.J., 2017. Study a scanning potential influence on probing ion trajectory in sense of the ion mirror effect. J. Univ. Babylon, 25: 1043-1057.
Direct Link  |  

Design and power by Medwell Web Development Team. © Medwell Publishing 2022 All Rights Reserved