Journal of Engineering and Applied Sciences
Year:
2012
Volume:
7
Issue:
2
Page No.
152 - 154
References
Arumi, D., R. Rodriguez-Montanes, J. Figueras, S. Eichenberger, C. Hora, B. Kruseman and M. Lousberg, 2007. IDDQ-based diagnosis at Very Low Voltage (VLV) for bridging defects. Electron. Lett., 43: 25-26.
Ramirez-Angulo, J. and G.G. Altamirano, 1996. High speed IDDQ current sensors for VLSI system testing. IEEE Int. Symp. Circuits Syst., 1: 389-392.
CrossRef | Sharma, N. and C.P. Ravikumar, 1996. Improving bridge-fault testability and confidence of IDDQ testing through circuit placement. Proceedings of the International Workshop on IDDQ Testing, October 24-25, 1996, Washington, DC, USA., pp: 20-24.
Shen, S.T., C. Liu, E.H. Ma, I.C. Cheng and J.C.M. Li, 2010. Reliability screening of a-Si TFT circuits: Very-low voltage and I
DDQ testing. J. Disp. Technol., 6: 592-600.
CrossRef | Soden, J.M. and C.F. Hawkins, 1989. Electrical properties and detection methods for CMOS IC defects. Proceedings of the 1st European Test Conference, April, 12-14, 1989, Paris, France, pp: 159-167.
Tang, J.J., K.J. Lee and B.D. Liu, 1995. A Practical current sensing technique for IDDQ testing. IEEE Trans. Sys., 3: 302-310.
Direct Link | Thibeault, C. and Y. Hariri, 2011. Improving current-based testing and diagnosis through modified test pattern generation. IEEE Trans. Very Large Scale Int. Sys., 19: 130-141.
Direct Link | Ul-Amin M.A., 1998. An approach to current sensor and test processor design for simultaneous logic and iddq testing of cmos integrated circuits. Masters Thesis, Faculty of Engineering, Universiti Kebangsaan Malaysia, Malaysia