References

Aminian, F. and M. Aminian, 2001. Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor. J. Electron. Test., 17: 29-36.
Direct Link  |  

Bandler, J.W. and A.E. Salama, 1985. Fault diagnosis of analog circuits. Proc. IEEE, 73: 1279-1325.
CrossRef  |  

Kondagunturi, R., E. Bradley, K. Maggard and C. Stroud, 1999. Benchmark circuits for analog and mixed-signal testing. Proceedings of the IEEE International Southeastcon'99 Conference on Technology on the Brink of 2000 (Cat. No.99CH36300), March 25-28, 1999, IEEE, Lexington, Kentucky, pp: 217-220.

Prasad, V.C. and N.S.C. Babu, 2000. Selection of test nodes for analog fault diagnosis in dictionary approach. IEEE Trans. Instrument. Measure., 49: 1289-1297.
CrossRef  |  

Slamani, M., B. Kaminska and G. Quesnel, 1994. An integrated approach for analog circuit testing with a minimum number of detected parameters. Proceedings of the International Conference on Conference Test, October 2-6, 1994, IEEE, Washington, DC, USA., pp: 631-640.

Yuan, L., Y. He, J. Huang and Y. Sun, 2010. A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans. Instrum. Meas., 59: 586-595.
CrossRef  |  Direct Link  |