References

Brandt, W., 1974. Logic test probe and indicator circuit US 3838339 A. United States Patent and Trademark Office, Alexandria, Virginia, USA.

De Micheli, G., 1994. Synthesis and Optimization of Digital Circuits. McGraw-Hill, New York.

Hoffman, M., 2004. An FPGA-based digital logic lab for computer organization and architecture. J. Comput. Sci. Colleges, 19: 214-227.
Direct Link  |  

McCluskey, E.J. and F.W. Clegg, 1971. Fault equivalence in combinational logic networks. IEEE. Trans. Comput., 100: 1286-1293.
CrossRef  |  Direct Link  |  

Microchip, 2016. A tmega48A/88A/168A complete datasheet. Microchip Technology, Chandler, Arizona, USA. http://www.atmel.com

Miyata, C. and H. Kashiwagi, 1993. Fault detection of logic circuit by use of m-sequence correlation method. Method Conf Inst Control Rob. Sys., 1: 24-29.
Direct Link  |  

Morris, M.M. and D.C. Michael, 2006. Digital Design. 4th Edn., Prentice-Hall, Upper Saddle River, New Jersey, USA.,.

Nelson, V.P., 1995. Digital Logic Circuit Analysis and Design. 2nd Edn., Prentice Hall, Upper Saddle River, New Jersey, USA., ISBN:9780134638942, Pages: 842.

Ono, A., M. Ichimiya, H. Yotsuyanagi, M. Takagi and M. Hashizume, 2008. Lead detection based on logical change caused by AC voltage signal stimulus. Proceedings of 2008 International Technical Conference on Circuits-Systems, Computers and Communications, July 7, 2008, NEC, Shimonoseki, Japan, pp: 241-244.

Zhao, Y., T. Xu and K. Chakrabarty, 2008. Built-in self-test and fault diagnosis for lab-on-chip using digital microfluidic logic gates. Proceedings of the IEEE International Conference on Test (ITC’08), October 28-30, 2008, IEEE, Santa Clara, California, USA., ISBN:978-1-4244-2402-3, pp: 1-10.